• DocumentCode
    1660691
  • Title

    Model class optimality in set membership identification

  • Author

    Giarré, Laura ; Milanese, Mario

  • Author_Institution
    Dipartimento di Autom. e Inf., Politecnico di Torino, Italy
  • Volume
    2
  • fYear
    1994
  • Firstpage
    1741
  • Abstract
    Model class optimality in set membership identification is investigated. Taking into account that the model selection has to be made using finite and noisy measurements, the n-width concept generalizes to the conditional radius of information concept. The aim of this paper is to show that model selection based on these two concepts may be drastically different. In particular it is shown how to compute the conditional radius of information in the H2 approximate identification of exponentially stable systems by means of FIR model class, which is the optimal one in the n-width sense. The “peaking effect” presented by the radius of information with respect of the FIR order is demonstrated, in opposition of the monotone decreasing behaviour of n-width. This implies the existence of a model class guaranteeing a lower worst-case identification error than the one provided by the optimal model class in the n-width sense. Numerical examples show that the improvements in using the optimal FIR model in the radius sense may be quite relevant even for moderate level of noise
  • Keywords
    identification; optimisation; set theory; stability; FIR model class; H2 approximate identification; conditional information radius; exponentially stable systems; finite noisy measurements; lower worst-case identification error; model class optimality; monotone decreasing behaviour; n-width concept; optimal model class; peaking effect; set membership identification; Adaptive control; Approximation error; Estimation error; Finite impulse response filter; Hydrogen; Noise level; Programmable control; Robust control; System identification;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Decision and Control, 1994., Proceedings of the 33rd IEEE Conference on
  • Conference_Location
    Lake Buena Vista, FL
  • Print_ISBN
    0-7803-1968-0
  • Type

    conf

  • DOI
    10.1109/CDC.1994.411184
  • Filename
    411184