Fault diagnosis of analog circuits by operation-region model and X-Y zoning method

An X-Y zoning method can detect faults of analog circuits by using the relationship between circuit inputs and outputs. An operation-region model can analyze/model circuit behaviors by observing changes in the operation regions of MOS transistors in a circuit. In this paper, we propose a method for diagnosing analog circuits by combining the OR model and the X-Y zoning method A diagnosis procedure is realized by the similar way to the method for digital circuits. In order to demonstrate the effectiveness of the proposed method, we apply the method to ITC´97 benchmark circuits with hard faults and soft faults. We obtained the result that the diagnostic resolution is one for every fault.