Title :
Fault diagnosis of analog circuits by operation-region model and X-Y zoning method
Author_Institution :
Graduate Sch. of Eng., Tokyo Metropolitan Univ., Japan
Abstract :
An X-Y zoning method can detect faults of analog circuits by using the relationship between circuit inputs and outputs. An operation-region model can analyze/model circuit behaviors by observing changes in the operation regions of MOS transistors in a circuit. In this paper, we propose a method for diagnosing analog circuits by combining the OR model and the X-Y zoning method A diagnosis procedure is realized by the similar way to the method for digital circuits. In order to demonstrate the effectiveness of the proposed method, we apply the method to ITC´97 benchmark circuits with hard faults and soft faults. We obtained the result that the diagnostic resolution is one for every fault.
Keywords :
MOS analogue integrated circuits; MOSFET; circuit simulation; fault diagnosis; integrated circuit modelling; ITC97 benchmark circuits; MOS transistor operation regions; OR model; X-Y zoning method; analog circuit fault diagnosis; circuit behaviors; circuit inputs; circuit outputs; diagnostic resolution; hard faults; operation-region model; soft faults; Analog circuits; Circuit analysis; Circuit faults; Circuit testing; Digital circuits; Electrical fault detection; Fault detection; Fault diagnosis; MOSFETs; Performance analysis;
Conference_Titel :
Defect and Fault Tolerance in VLSI Systems, 2004. DFT 2004. Proceedings. 19th IEEE International Symposium on
Print_ISBN :
0-7695-2241-6
DOI :
10.1109/DFTVS.2004.1347844
