• DocumentCode
    1660910
  • Title

    Coupling different methodologies to validate obsolete microprocessors

  • Author

    Anghel, L. ; Sanchez, E. ; Reorda, M. Sonza ; Squillero, G. ; Velazco, R.

  • Author_Institution
    TIMA Lab., Grenoble, France
  • fYear
    2004
  • Firstpage
    250
  • Lastpage
    255
  • Abstract
    The actual operating life time for many electronic systems turned out to be much longer than originally foreseen, leading to the use of obsolete components in critical projects. To skip microprocessor obsolescence problems, companies should have bought larger stocks of components when still available, or are forced to find parts in secondary markets later. Alternatively, a suitable low-cost solution could be replacing the obsolete component by emulating its functionalities with a programmable logic device. However, design verification of microprocessors is well known as a challenging task. This paper proposes a coupled methodology to generate test-programs, using complementary techniques: one pseudoexhaustive and one driven by an evolutionary optimizer. As a case study, the Motorola 6800 was targeted.
  • Keywords
    automatic test pattern generation; circuit optimisation; evolutionary computation; integrated circuit design; logic design; microprocessor chips; programmable logic devices; Motorola 6800; complementary techniques; coupled methodology; critical projects; design verification; electronic systems; evolutionary optimizer driven technique; microprocessor obsolescence problems; obsolete components; obsolete microprocessor validation; operating life time; programmable logic device replacement; pseudo-exhaustive technique; secondary markets; test-program generation; Automatic testing; Companies; Couplings; Emulation; Field programmable gate arrays; Laboratories; Manufacturing; Microprocessors; Optimization methods; Programmable logic devices;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Defect and Fault Tolerance in VLSI Systems, 2004. DFT 2004. Proceedings. 19th IEEE International Symposium on
  • ISSN
    1550-5774
  • Print_ISBN
    0-7695-2241-6
  • Type

    conf

  • DOI
    10.1109/DFTVS.2004.1347846
  • Filename
    1347846