DocumentCode :
1661177
Title :
Design of concurrent error-detectable VLSI-based array dividers
Author :
Chen, Thou-Ho ; Chen, Liang-Gee ; Chang, Yi-Shing
Author_Institution :
Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan
fYear :
1992
Firstpage :
72
Lastpage :
75
Abstract :
A building-block design for VLSI-based array dividers with concurrent error detection by recomputing using partitioned architecture (REPA) is proposed. The basic concept is that the divide array can be divided into two identical parts and its operation can be completed by using one part through two iterative calculations. With two such parts, a concurrent error detection scheme based on a space redundancy approach can be designed, and error detection is achieved at each iteration. The design is better than previous designs in terms of area requirement, time penalty, error detection capability, and detection period. Advanced analysis with m partitions is included. The experimental results are attractive, especially for certain designs with application-specified tradeoffs between speed performance and area cost
Keywords :
VLSI; digital arithmetic; dividing circuits; error detection; fault tolerant computing; application-specified tradeoffs; area cost; area requirement; concurrent error detection; concurrent error-detectable VLSI-based array dividers; divide array; recomputing using partitioned architecture; space redundancy approach; speed performance; time penalty; Arithmetic; Circuit faults; Costs; Fault diagnosis; Fault tolerant systems; Integrated circuit interconnections; Process design; Redundancy; Reliability; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer Design: VLSI in Computers and Processors, 1992. ICCD '92. Proceedings, IEEE 1992 International Conference on
Conference_Location :
Cambridge, MA
Print_ISBN :
0-8186-3110-4
Type :
conf
DOI :
10.1109/ICCD.1992.276204
Filename :
276204
Link To Document :
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