• DocumentCode
    1661345
  • Title

    Behavioral synthesis for easy testability in data path allocation

  • Author

    Lee, Tien-Chien ; Wolf, Wayne H. ; Jha, Niraj K. ; Acken, John M.

  • Author_Institution
    Dept. of Electr. Eng., Princeton Univ., NJ, USA
  • fYear
    1992
  • Firstpage
    29
  • Lastpage
    32
  • Abstract
    The first behavioral synthesis scheme for improving testability in data path allocation independent of test strategy is presented. The authors propose two behavioral synthesis-for-test heuristics: improve observability and controllability of registers, and reduce sequential depth between registers. Also presented are algorithms that optimize a behavior-level design using these two criteria while minimizing area. Experimental results for benchmark circuits synthesized by the author´s experimental system. PHITS, show that these methods give a high fault coverage in small amounts of CPU time at a low area overhead
  • Keywords
    controllability; logic design; logic testing; observability; PHITS; behavioral synthesis-for-test heuristics; behavioural synthesis; benchmark circuits; controllability; data path allocation; easy testability; high fault coverage; low area overhead; observability; registers; sequential depth; test strategy; Algorithm design and analysis; Benchmark testing; Circuit faults; Circuit synthesis; Circuit testing; Control system synthesis; Controllability; Design optimization; Observability; Registers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Design: VLSI in Computers and Processors, 1992. ICCD '92. Proceedings, IEEE 1992 International Conference on
  • Conference_Location
    Cambridge, MA
  • Print_ISBN
    0-8186-3110-4
  • Type

    conf

  • DOI
    10.1109/ICCD.1992.276212
  • Filename
    276212