DocumentCode :
1661345
Title :
Behavioral synthesis for easy testability in data path allocation
Author :
Lee, Tien-Chien ; Wolf, Wayne H. ; Jha, Niraj K. ; Acken, John M.
Author_Institution :
Dept. of Electr. Eng., Princeton Univ., NJ, USA
fYear :
1992
Firstpage :
29
Lastpage :
32
Abstract :
The first behavioral synthesis scheme for improving testability in data path allocation independent of test strategy is presented. The authors propose two behavioral synthesis-for-test heuristics: improve observability and controllability of registers, and reduce sequential depth between registers. Also presented are algorithms that optimize a behavior-level design using these two criteria while minimizing area. Experimental results for benchmark circuits synthesized by the author´s experimental system. PHITS, show that these methods give a high fault coverage in small amounts of CPU time at a low area overhead
Keywords :
controllability; logic design; logic testing; observability; PHITS; behavioral synthesis-for-test heuristics; behavioural synthesis; benchmark circuits; controllability; data path allocation; easy testability; high fault coverage; low area overhead; observability; registers; sequential depth; test strategy; Algorithm design and analysis; Benchmark testing; Circuit faults; Circuit synthesis; Circuit testing; Control system synthesis; Controllability; Design optimization; Observability; Registers;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer Design: VLSI in Computers and Processors, 1992. ICCD '92. Proceedings, IEEE 1992 International Conference on
Conference_Location :
Cambridge, MA
Print_ISBN :
0-8186-3110-4
Type :
conf
DOI :
10.1109/ICCD.1992.276212
Filename :
276212
Link To Document :
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