Title :
The design of CMOS real-time motion-direction detection chip with BJT-based silicon-retina sensors and correlation-based motion detection algorithm
Author :
Wu, Chung-Yu ; Huang, Kuan-Hsun ; Lin, Li-Ju
Author_Institution :
Integrated Circuits & Syst. Lab., Nat. Chiao Tung Univ., Hsinchu, Taiwan
fDate :
6/23/1905 12:00:00 AM
Abstract :
In this paper, a new CMOS real-time motion-direction detector using the bipolar junction transistor (BJT)-based silicon retina is proposed and implemented. In the proposed design, a correlation-based algorithm is adopted to determine the motion direction of the object image projected on the chip, while the BJT-based silicon retina is adopted to enhance the capability of image acquisition and edge-extraction preprocessing. An experimental chip consisting of a 32×32 pixel array and peripheral arithmetic units is designed and fabricated using a 0.5 μm single-poly-triple-metal CMOS process. The pixel size is 100×100 μm2 with a fill factor of 11.6%, while the total chip area is 4200×4000 μm2. The measurement results have verified the correct function of the fabricated chip. The measured optical dynamic range is 82 dB, the supply voltage is 5 V and the power consumption is 120 mW
Keywords :
CMOS image sensors; bipolar transistors; digital arithmetic; edge detection; elemental semiconductors; image motion analysis; integrated circuit design; integrated circuit measurement; optical correlation; real-time systems; silicon; 0.5 micron; 100 micron; 120 mW; 4000 micron; 4200 micron; 5 V; BJT-based silicon-retina sensors; CMOS real-time motion-direction detection chip design; CMOS real-time motion-direction detector; Si; bipolar junction transistor-based silicon retina sensors; chip measurement; correlation-based algorithm; correlation-based motion detection algorithm; edge-extraction preprocessing; fill factor; image acquisition; object image motion direction; optical dynamic range; peripheral arithmetic units; pixel array; pixel size; power consumption; single-poly-triple-metal CMOS process; supply voltage; total chip area; Algorithm design and analysis; Arithmetic; CMOS process; Detectors; Image edge detection; Motion detection; Power measurement; Retina; Semiconductor device measurement; Silicon;
Conference_Titel :
Electronics, Circuits and Systems, 2001. ICECS 2001. The 8th IEEE International Conference on
Print_ISBN :
0-7803-7057-0
DOI :
10.1109/ICECS.2001.957694