DocumentCode :
166144
Title :
Sources of error in full-system simulation
Author :
Gutierrez, Alvaro ; Pusdesris, Joseph ; Dreslinski, Ronald G. ; Mudge, Trevor ; Sudanthi, Chander ; Emmons, Christopher D. ; Hayenga, Mitchell ; Paver, Nigel
Author_Institution :
Adv. Comput. Archit. Lab., Univ. of Michigan - Ann Arbor, Ann Arbor, MI, USA
fYear :
2014
fDate :
23-25 March 2014
Firstpage :
13
Lastpage :
22
Abstract :
In this work we investigate the sources of error in gem5-a state-of-the-art computer simulator-by validating it against a real hardware platform: the ARM Versatile Express TC2 development board. We design a custom gem5 configuration and make several changes to the simulator itself in order to more closely match the Versatile Express TC2 board. With the modifications we make to the simulator, we are able to achieve a mean percentage runtime error of 5% and a mean absolute percentage runtime error of 13% for the SPEC CPU2006 benchmarks. For the PARSEC benchmarks we achieve a mean percentage runtime error of -11% and -12% for single and dual-core runs respectively, and a mean absolute percentage runtime error of 16% and 17% for single and dual-core runs respectively. While prior work typically considers only runtime accuracy, we extend our investigation to include several key microarchitectural statistics as well, showing that we can achieve accuracy within 20% on average for a majority of them. Much of this error is likely from modeling similar, but not identical components.
Keywords :
digital simulation; statistical analysis; system-on-chip; ARM Versatile Express TC2 development board; PARSEC benchmarks; SPEC CPU2006 benchmarks; dual-core run; error sources; full-system simulation; gem5 computer simulator; gem5 configuration; microarchitectural statistics; single-core run; Accuracy; Benchmark testing; Hardware; Pipelines; Prefetching; Registers; Runtime; computer architecture; computer simulation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Performance Analysis of Systems and Software (ISPASS), 2014 IEEE International Symposium on
Conference_Location :
Monterey, CA
Print_ISBN :
978-1-4799-3604-5
Type :
conf
DOI :
10.1109/ISPASS.2014.6844457
Filename :
6844457
Link To Document :
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