DocumentCode
1661627
Title
Author index
fYear
2004
Firstpage
505
Lastpage
506
Abstract
The author index contains an entry for each author and coauthor included in the proceedings record.
fLanguage
English
Publisher
ieee
Conference_Titel
Defect and Fault Tolerance in VLSI Systems, 2004. DFT 2004. Proceedings. 19th IEEE International Symposium on
Conference_Location
Cannes, France
ISSN
1550-5774
Print_ISBN
0-7695-2241-6
Type
conf
DOI
10.1109/DFTVS.2004.1347876
Filename
1347876
Link To Document