• DocumentCode
    1661627
  • Title

    Author index

  • fYear
    2004
  • Firstpage
    505
  • Lastpage
    506
  • Abstract
    The author index contains an entry for each author and coauthor included in the proceedings record.
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Defect and Fault Tolerance in VLSI Systems, 2004. DFT 2004. Proceedings. 19th IEEE International Symposium on
  • Conference_Location
    Cannes, France
  • ISSN
    1550-5774
  • Print_ISBN
    0-7695-2241-6
  • Type

    conf

  • DOI
    10.1109/DFTVS.2004.1347876
  • Filename
    1347876