Title :
Robustsless Enhancement And Detection Threshold Reduction In ATPG For Gate Delay Faults
Author :
Mao, Weiwei ; Giletti, M.D.
Keywords :
Automatic test pattern generation; Circuit faults; Circuit testing; Delay; Electrical fault detection; Fault detection; Logic testing; Robustness; Springs; Test pattern generators;
Conference_Titel :
Test Conference, 1992. Proceedings., International
Print_ISBN :
0-7803-0760-7
DOI :
10.1109/TEST.1992.527879
