مرکز منطقه ای اطلاع رساني علوم و فناوري

DocumentCode :

1662239

Title :

TRANSPARENT BIST FOR RAMS

Author :

Nicolaidis, M.

fYear :

1992

Firstpage :

598

Keywords :

Algorithm design and analysis; Built-in self-test; Circuit faults; Circuit testing; Compaction; Fabrication; Handwriting recognition; Pattern analysis; Read-write memory; System testing;

fLanguage :

English

Publisher :

ieee

Conference_Titel :

Test Conference, 1992. Proceedings., International

ISSN :

1089-3539

Print_ISBN :

0-7803-0760-7

Type :

conf

DOI :

10.1109/TEST.1992.527880

Filename :

527880

Link To Document :

https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1662239