Title :
End-to-end testability analysis and DfT insertion for mixed-signal paths
Author :
Ozev, Sule ; Orailoglu, Alex
Author_Institution :
Duke Univ., Durham, NC, USA
Abstract :
Increasing system complexity and test cost demands new system-level solutions for mixed-signal systems. In this paper, we present a testability analysis and DfT insertion methodology for end-to-end mixed-signal paths. Based on behavioral models and path analysis, testability problems in the path are determined and classified in terms of their bottleneck. Possible solutions to each problem are identified. The DfT insertion problem is then formulated as a min-cost set cover problem to achieve the most cost-efficient solution. In experimental results where test point insertion is used as the DfT approach, nearly 50% reduction in the overall DfT overhead is achieved.
Keywords :
design for testability; integrated circuit testing; mixed analogue-digital integrated circuits; DfT insertion methodology; end-to-end testability analysis; mixed signal paths; mixed signal systems; path analysis; Automatic testing; Built-in self-test; Circuit testing; Costs; Frequency; Jitter; Manufacturing automation; Phase locked loops; Phase noise; System testing;
Conference_Titel :
Computer Design: VLSI in Computers and Processors, 2004. ICCD 2004. Proceedings. IEEE International Conference on
Print_ISBN :
0-7695-2231-9
DOI :
10.1109/ICCD.2004.1347902