Title :
DACCT-dynamic ACCess testing of IBM large systems
Author :
Alter, Jeffrey I.
Author_Institution :
IBM Corp., Poughkeepsie, NY, USA
Abstract :
A description is given of DACCT, a pseudorandom test program generator that tests implicit and explicit storage accesses, and its testing philosophy and programming techniques are discussed. DACCT produces a stressful test environment for a computer system and, by focusing on both explicit and implicit data accesses, finds design problems in several of the testing focus areas. DACCT´s testing methods, error reports, and recreation abilities offered improved detection design problems as compared with the use of an operating system
Keywords :
IBM computers; computer testing; DACCT; IBM large systems; design problems; dynamic ACCess testing; pseudorandom test program generator; storage accesses; Authorization; Cache storage; Computer aided instruction; Computer architecture; Operating systems; Protection; Robustness; Stress; Switches; System testing;
Conference_Titel :
Computer Design: VLSI in Computers and Processors, 1992. ICCD '92. Proceedings, IEEE 1992 International Conference on
Conference_Location :
Cambridge, MA
Print_ISBN :
0-8186-3110-4
DOI :
10.1109/ICCD.1992.276259
