BIST generators for sequential faults

Author

Zhang, S. ; Byrne, R. ; Miller, D.M.

Author_Institution

Dept. of Comput. Sci., Victoria Univ., BC, Canada

fYear

1992

Firstpage

260

Lastpage

263

Abstract

The authors consider faults with sequential behavior, e.g., delay or stuck-open faults, and discuss the state transition properties of linear-feedback-shift-register (LFSR) and one-dimensional linear-hybrid-cellular-automata (LHCA) test pattern generators. Upper and lower bounds on the transition coverage of any general n-cell generator with a period of 2ⁿ-1 are presented. It is shown that an XLHCA/XLFSR test pattern generator, which is derived from an LHCA/LFSR by grouping the odd and even numbered cell outputs, has superior transition coverage. On the basis of analysis and results of simulating the ISCAS´85 benchmark circuits, it is concluded that the XLHCA and XLFSR are excellent candidates for test pattern generators in BIST to detect faults with sequential behavior

Keywords

built-in self test; cellular automata; delays; fault location; feedback; logic testing; shift registers; XLHCA/XLFSR test pattern generator; benchmark circuits; built-in self-test generators; delay; linear-feedback-shift-register; lower bounds; one-dimensional linear-hybrid-cellular-automata; sequential faults; state transition properties; stuck-open faults; upper bounds; Analytical models; Benchmark testing; Built-in self-test; Circuit faults; Circuit simulation; Delay; Electrical fault detection; Fault detection; Pattern analysis; Test pattern generators;

fLanguage

English

Publisher

ieee

Conference_Titel

Computer Design: VLSI in Computers and Processors, 1992. ICCD '92. Proceedings, IEEE 1992 International Conference on

Conference_Location

Cambridge, MA

Print_ISBN

0-8186-3110-4

Type

conf

DOI

10.1109/ICCD.1992.276264

Filename

276264