DocumentCode :
1662594
Title :
Method for testing and characterization of analog-digital systems
Author :
Zagursky, V.
Author_Institution :
Fac. of Comput. Sci. & Eng., Riga Tech. Univ., Latvia
Volume :
1
fYear :
2001
fDate :
6/23/1905 12:00:00 AM
Firstpage :
309
Abstract :
The author proposes a method of testing of analog-digital systems (ADS). A linear inertial heteroscedastic ADS model, that takes account of nonlinear and inertial conversion effects is developed. The validity of the model is verified by actual measurements of the dynamic responses of an analog-digital converter (ADC)
Keywords :
analogue-digital conversion; dynamic response; inertial systems; integrated circuit modelling; ADS; analog-digital converter; analog-digital systems; dynamic responses; inertial conversion effects; linear inertial heteroscedastic model; nonlinear conversion effects; Analog-digital conversion; Computer science; Differential equations; Digital systems; Electronic equipment testing; Frequency response; Linear approximation; Manufacturing; Signal to noise ratio; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics, Circuits and Systems, 2001. ICECS 2001. The 8th IEEE International Conference on
Print_ISBN :
0-7803-7057-0
Type :
conf
DOI :
10.1109/ICECS.2001.957741
Filename :
957741
Link To Document :
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