DocumentCode :
1662605
Title :
Effect of quantum capacitance on switching speed in T-CNFETs
Author :
Zhou, Hailiang ; Zhang, Minxuan ; Hao, Yue
Author_Institution :
Nat. Lab. for Parallel & Distrib. Process., Nat. Univ. of Defense Technol., Changsha, China
fYear :
2010
Firstpage :
614
Lastpage :
615
Abstract :
The effect of quantum capacitance (QC) on the switching speed in T-CNFETs (Tunneling Carbon Nanotube Field Effect Transistors) is investigated with simulation using NEGF (Non-Equilibrium Green´s Function) formalism. Firstly, based on the analytical expression of SS, a quantitative study of the source/drain leads doping level is made to obtain an averaged inverse subthreshold slope(SS) as small as possible. And then the impact of QC on the gate control, thus on SS, is studied. Lastly, for the first time, approaches for restricting the impacts of QC are investigated, such as tuning the drain-source bias condition or CNT diameter which are governed by the analytical expression presented at the end of this paper. The modeling results reveal that the QC in T-CNFET has a negative impact on both the SS and on-current, and such impact could be restricted effectively with a proper choice of drain-source voltage and CNT chirality.
Keywords :
Green´s function methods; carbon nanotubes; deep levels; field effect transistors; tuning; C; CNT chirality; CNT diameter; NEGF simulation; T-CNFETs; averaged inverse subthreshold slope; doping level; drain-source bias condition; drain-source voltage; gate control; negative impact; nonequilibrium Green´s Function formalism; quantum capacitance; switching speed; tuning; tunneling carbon nanotube field effect transistors; CNTFETs; Doping; Electrons; Green´s function methods; Iron; PIN photodiodes; Quantum capacitance; Semiconductor process modeling; Tunneling; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nanoelectronics Conference (INEC), 2010 3rd International
Conference_Location :
Hong Kong
Print_ISBN :
978-1-4244-3543-2
Electronic_ISBN :
978-1-4244-3544-9
Type :
conf
DOI :
10.1109/INEC.2010.5424737
Filename :
5424737
Link To Document :
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