Title :
Improved 1 kHz capacitance calibration uncertainty
Author :
Jeffery, Anne-Marie ; Koffman, Andrew D.
Author_Institution :
Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA
fDate :
6/24/1905 12:00:00 AM
Abstract :
Uncertainties for 1 kHz capacitance calibrations have been decreased at the National Institute of Standards and Technology (NIST). The improvements are based on frequency-dependence characterization from 1592 Hz to 1 kHz. The relevant measurements and the traceability procedures from the calculable capacitor to the customer calibration are described.
Keywords :
calibration; capacitance measurement; measurement standards; measurement uncertainty; units (measurement); 1 kHz; 1 kHz capacitance; 1592 Hz to 1 kHz; NIST; National Institute of Standards and Technology; farad; fused-silica capacitor; impedance; measurement uncertainty; units; Bridge circuits; Calibration; Capacitance measurement; Capacitors; Electrical resistance measurement; Frequency measurement; Impedance; Laboratories; Measurement uncertainty; NIST;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 2002. IMTC/2002. Proceedings of the 19th IEEE
Print_ISBN :
0-7803-7218-2
DOI :
10.1109/IMTC.2002.1006818
