DocumentCode
1662678
Title
Improved 1 kHz capacitance calibration uncertainty
Author
Jeffery, Anne-Marie ; Koffman, Andrew D.
Author_Institution
Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA
Volume
1
fYear
2002
fDate
6/24/1905 12:00:00 AM
Firstpage
73
Abstract
Uncertainties for 1 kHz capacitance calibrations have been decreased at the National Institute of Standards and Technology (NIST). The improvements are based on frequency-dependence characterization from 1592 Hz to 1 kHz. The relevant measurements and the traceability procedures from the calculable capacitor to the customer calibration are described.
Keywords
calibration; capacitance measurement; measurement standards; measurement uncertainty; units (measurement); 1 kHz; 1 kHz capacitance; 1592 Hz to 1 kHz; NIST; National Institute of Standards and Technology; farad; fused-silica capacitor; impedance; measurement uncertainty; units; Bridge circuits; Calibration; Capacitance measurement; Capacitors; Electrical resistance measurement; Frequency measurement; Impedance; Laboratories; Measurement uncertainty; NIST;
fLanguage
English
Publisher
ieee
Conference_Titel
Instrumentation and Measurement Technology Conference, 2002. IMTC/2002. Proceedings of the 19th IEEE
ISSN
1091-5281
Print_ISBN
0-7803-7218-2
Type
conf
DOI
10.1109/IMTC.2002.1006818
Filename
1006818
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