Title :
Low noise, microwave signal generation using bulk and surface acoustic wave resonators
Author_Institution :
Westinghouse Electr. Corp., Baltimore, MD, USA
Abstract :
The use of high-Q bulk and surface acoustic wave resonators, which provides a means for generation of low-noise microwave carrier signals, is discussed. The resulting signal phase noise spectrum consists of two distinct regions. In the near-carrier region, the spectrum is characterized by flicker of frequency noise usually due to short-term instability in the oscillator acoustic resonator itself. The spectral density of the fractional frequency fluctuations provides a convenient measure for comparing the short-term frequency stability of resonators operating in different frequency ranges. The lowest near-carrier noise levels are obtained by frequency multiplication of a lower frequency oscillator using a correspondingly higher Q resonator. Frequency multiplication, however, results in higher relative noise floor levels at high carrier offset frequencies. Techniques for obtaining low-noise floor levels are discussed. In addition, HBAR (high overtone, bulk acoustic resonator) and UHF HBAR oscillator performance are described
Keywords :
acoustic resonators; frequency stability; microwave generation; surface acoustic wave devices; acoustic resonator; flicker; frequency fluctuations; frequency multiplication; frequency noise; frequency stability; high Q bulk acoustic wave resonator; low-noise microwave carrier signals; microwave signal generation; near-carrier noise; oscillator; short-term instability; spectral density; surface acoustic wave resonators; Acoustic noise; Acoustic waves; Frequency conversion; Microwave generation; Noise generators; Noise level; Oscillators; Phase noise; Signal generators; Surface acoustic waves;
Conference_Titel :
Frequency Control Symposium, 1988., Proceedings of the 42nd Annual
Conference_Location :
Baltimore, MD
DOI :
10.1109/FREQ.1988.27627