Title :
Real-time tool wear identification using sensor integration with neural network
Author :
Levy, Nouri ; Zhou, MengChu ; Quan, Yu
Author_Institution :
Dept. of Mech. & Ind. Eng., New Jersey Inst. of Technol., Newark, NJ, USA
Abstract :
Real-time identification of tool wear in shop floor environment is essential for optimization of machining processes and implementation of automated manufacturing systems. In this paper. the signals obtained from acoustic emission and power sensors during machining processes are analyzed and a set of feature parameters characterizing the tool wear condition are extracted. In order to realize the realtime tool wear condition monitoring for different cutting conditions, a sensor integration strategy which combines the information from multiple sensors (acoustic emission sensor and power sensor) and machining parameters is proposed. A neural network based on improved back-propogation algorithm is developed and a prototype scheme for realtime identification of tool wear is implemented. Experiments under different conditions have proved that a higher rate of tool wear identification can be achieved by using the sensor integration model with neural network. The results also indicated that the neural network is a very effective method of sensor integration for online monitoring of tool abnormalities
Keywords :
acoustic variables measurement; backpropagation; computerised monitoring; industrial control; machining; monitoring; neural nets; power measurement; real-time systems; sensor fusion; acoustic emission sensor; back-propogation; condition monitoring; machining parameters; machining process optimization; neural network; online tool abnormality monitoring; power sensors; real-time tool wear identification; sensor integration; Acoustic emission; Acoustic sensors; Machining; Manufacturing systems; Neural networks; Real time systems; Sensor phenomena and characterization; Signal analysis; Signal processing; Wearable sensors;
Conference_Titel :
Decision and Control, 1994., Proceedings of the 33rd IEEE Conference on
Conference_Location :
Lake Buena Vista, FL
Print_ISBN :
0-7803-1968-0
DOI :
10.1109/CDC.1994.411283