DocumentCode :
1662773
Title :
Feedforward learning-nonlinear processes and adaptation
Author :
Tao, K. Mike ; Kosut, Robert L. ; Ekblad, Mark
Author_Institution :
Integrated Syst. Inc., Santa Clara, CA, USA
Volume :
2
fYear :
1994
Firstpage :
1060
Abstract :
A feedforward learning control (LC) scheme is reported in this paper. This scheme is applicable to a class of smoothly nonlinear (repetitive) control tasks. Rapid reductions in tracking error are demonstrated using a single-input, single-output (SISO), nonlinear model of the rapid thermal processing (RTP) wafer manufacturing process. This scheme preserves the simplicity of the basic LC scheme reported in Tao, Kosut, and Aral (1994) by using the (measurable) impulse response model. Since the “impulse response” of a nonlinear process varies as the process trajectory moves along, adaptation is used to adjust the impulse response model between task repeats. Analytical justifications for the proposed adaptation are provided using a nonlinear equation solving analogy. Extension to the multi-input and multi-output (MIMO) case is also included
Keywords :
feedforward; learning systems; nonlinear control systems; process control; rapid thermal processing; tracking; transient response; adaptation; feedforward learning control; impulse response model; multi-input multi-output; nonlinear processes; rapid thermal processing wafer manufacturing process; single-input single-output nonlinear model; smoothly nonlinear repetitive control tasks; tracking error; Automatic control; Control systems; MIMO; Nonlinear control systems; Nonlinear equations; Pulse measurements; Rapid thermal processing; Robust control; Semiconductor device modeling; Signal processing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Decision and Control, 1994., Proceedings of the 33rd IEEE Conference on
Conference_Location :
Lake Buena Vista, FL
Print_ISBN :
0-7803-1968-0
Type :
conf
DOI :
10.1109/CDC.1994.411286
Filename :
411286
Link To Document :
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