Title :
Multiple input bridging fault detection in CMOS sequential circuits
Author :
Jha, Niraj K. ; Wang, S.-J. ; Gripka, Phillip C.
Author_Institution :
Dept. of Electr. Eng., Princeton Univ., NJ, USA
Abstract :
Bridging fault testing algorithms for CMOS sequential circuits, assuming current supply monitoring, are discussed. Sequential circuits implemented both with and without scan design are considered. Experimental results are given to show the efficacy of the methods
Keywords :
CMOS integrated circuits; fault location; logic testing; sequential circuits; CMOS sequential circuits; current supply monitoring; fault testing algorithms; multiple input bridging fault detection; scan design; Circuit faults; Circuit testing; Current supplies; Electrical fault detection; Fault detection; Logic testing; Monitoring; Sequential analysis; Sequential circuits; Very large scale integration;
Conference_Titel :
Computer Design: VLSI in Computers and Processors, 1992. ICCD '92. Proceedings, IEEE 1992 International Conference on
Conference_Location :
Cambridge, MA
Print_ISBN :
0-8186-3110-4
DOI :
10.1109/ICCD.1992.276291
