DocumentCode
1663205
Title
Inertia tensor as a way of feature vector definition for one-dimensional signatures
Author
Bakhadyrov, Izzat ; Jafari, Mohsen A.
Author_Institution
Dept. of Ind. Eng., Rutgers Univ., Piscataway, NJ, USA
Volume
2
fYear
1999
fDate
6/21/1905 12:00:00 AM
Firstpage
904
Abstract
Signature is a simple representation of an object or a process in the form of a mathematical function, a feature vector, a geometric shape, or others, intended to uniquely capture the significant characteristics of an object or a process at a certain state. Often, signature is used alone as a feature vector. But in many applications signature to feature space transformation can be done to reveal specific important features of signature itself, e.g. shape or statistical properties, and therefore significantly reduce the number of features. Such transformation can be done in number of ways, e.g. using wavelet or statistical analysis. In this paper we propose a novel technique of revealing different shape and statistical properties of a signature by treating it as a discrete rigid body and computing its inertia tensor and mass center coordinates. We study two basic cases of different mass distribution. We demonstrate the use of this method of surface analysis of ceramic parts manufactured by layered manufacturing technique
Keywords
logic testing; signal processing; statistical analysis; wavelet transforms; discrete rigid body; feature space transformation; feature vector; feature vector definition; geometric shape; inertia tensor; layered manufacturing technique; mass center coordinates; mathematical function; object representation; one-dimensional signatures; statistical analysis; statistical properties; wavelet; Character recognition; Image analysis; Image processing; Image recognition; Image segmentation; Image texture analysis; Industrial engineering; Radar imaging; Shape; Tensile stress;
fLanguage
English
Publisher
ieee
Conference_Titel
Systems, Man, and Cybernetics, 1999. IEEE SMC '99 Conference Proceedings. 1999 IEEE International Conference on
Conference_Location
Tokyo
ISSN
1062-922X
Print_ISBN
0-7803-5731-0
Type
conf
DOI
10.1109/ICSMC.1999.825382
Filename
825382
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