DocumentCode :
1663849
Title :
A 16mW 78dB-SNDR 10MHz-BW CT-ΔΣ ADC using residue-cancelling VCO-based quantizer
Author :
Reddy, Karthikeyan ; Rao, Sachin ; Inti, Rajesh ; Young, Brian ; Elshazly, Amr ; Talegaonkar, Mrunmay ; Hanumolu, Pavan Kumar
Author_Institution :
Oregon State Univ., Corvallis, OR, USA
fYear :
2012
Firstpage :
152
Lastpage :
154
Abstract :
Voltage-controlled oscillator (VCO) based analog-to-digital conversion presents an attractive means of implementing high-bandwidth oversampling ADCs [1,2]. They exhibit inherent noise-shaping properties and can operate at low supply voltages and high sampling rates [1-3]. However, usage of VCO-based ADCs has been limited due to their nonlinear voltage-to-frequency (V-to-F) transfer characteristic, which severely degrades their distortion performance. Digital calibration is used to combat nonlinearity in an open-loop VCO-based ADC, but 1st-order noise-shaping mandates high OSRs, thus increasing power dissipation in digital circuits, even in a nanometer-scale CMOS process [1]. In [2], nonlinearity is suppressed by embedding the VCO in a ΔΣ loop. While this technique works in principle, the need for large loop gain at high frequencies makes it very difficult to achieve high SNDR. For instance, the suppression level near the band edge is approximately 20dB for a VCO-based 2nd-order modulator operating with an over-sampling ratio (OSR) of 30. Our ADC overcomes the impact of VCO non-linearity by minimizing the input signal processed by the VCO. The prototype achieves 78.3dB SNDR in a 10MHz signal bandwidth at 600MHz sampling rate, while consuming 16mW power.
Keywords :
CMOS integrated circuits; analogue-digital conversion; delta-sigma modulation; integrated circuit noise; low-power electronics; sampling methods; voltage-controlled oscillators; ΔΣ loop; 1st-order noise-shaping; BW CT-ΔΣ ADC; SNDR; V-to-F transfer characteristic; VCO-based 2nd-order modulator; analog-to-digital conversion; bandwidth 10 MHz; digital calibration; digital circuit; distortion performance; frequency 600 MHz; high sampling rate; high-bandwidth oversampling ADC; loop gain; low supply voltage; nanometer-scale CMOS process; noise figure 78 dB; noise figure 78.3 dB; noise-shaping properties; nonlinear voltage-to-frequency transfer characteristic; open-loop VCO-based ADC; over-sampling ratio; power 16 mW; power dissipation; residue-cancelling VCO-based quantizer; suppression level; voltage-controlled oscillator; Bandwidth; Clocks; Finite impulse response filter; Modulation; Power harmonic filters; Voltage-controlled oscillators;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Circuits Conference Digest of Technical Papers (ISSCC), 2012 IEEE International
Conference_Location :
San Francisco, CA
ISSN :
0193-6530
Print_ISBN :
978-1-4673-0376-7
Type :
conf
DOI :
10.1109/ISSCC.2012.6176955
Filename :
6176955
Link To Document :
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