Title :
Theory and design of two-rail totally self-checking basic building blocks
Author :
Jiang, Zhi-Jian ; Venkatesan, R.
Author_Institution :
Fac. of Eng. & Appl. Sci., Memorial Univ. of Newfoundland, St. John´´s, Nfld., Canada
Abstract :
A concept called the two-rail (TR) totally self-checking (TSC) intrinsic/extrinsic state space is introduced. A strong morphic Boolean algebra is proposed to formalize the operations of TR-TSC circuits in intrinsic state space. A classification of TSC checkers is suggested to describe the behavior of various checkers in extrinsic state space. Three types of basic building blocks are developed. The simple interconnection method (SIM) and image design method (IDM) for the design of two-rail TSC functional circuits are presented
Keywords :
Boolean functions; built-in self test; logic design; logic testing; image design method; simple interconnection method; strong morphic Boolean algebra; two-rail totally self-checking basic building blocks; Boolean algebra; Circuit faults; Design methodology; Digital circuits; Flexible printed circuits; Input variables; Logic circuits; Logic design; Logic functions; State-space methods;
Conference_Titel :
Computer Design: VLSI in Computers and Processors, 1992. ICCD '92. Proceedings, IEEE 1992 International Conference on
Conference_Location :
Cambridge, MA
Print_ISBN :
0-8186-3110-4
DOI :
10.1109/ICCD.1992.276322
