DocumentCode :
1663884
Title :
Wavelet transform with spectral post-processing for enhanced feature extraction
Author :
Wang, Changting ; Gao, Robert X.
Author_Institution :
Dept. of Mech. & Ind. Eng., Massachusetts Univ., Amherst, MA, USA
Volume :
1
fYear :
2002
fDate :
6/24/1905 12:00:00 AM
Firstpage :
315
Abstract :
The quality of machine condition monitoring techniques as well as their applicability in the industry are determined by the effectiveness and efficiency with which characteristic signal features are extracted and identified. Because of the weak amplitude and short duration of structural defect signals at the incipient stage, it is generally difficult to extract hidden features from the data measured using conventional spectral techniques. A new approach based on a combined wavelet and Fourier transformations is presented in this paper. Experimental studies on a rolling bearing with a localized point defect of 0.25 mm diameter has shown that this new technique provides significantly improved feature extraction capability over the spectral techniques.
Keywords :
Fourier transforms; condition monitoring; fault location; feature extraction; wavelet transforms; 0.25 mm; Fourier transformations; characteristic signal features; feature extraction; hidden features; industry; localized point defect; machine condition monitoring techniques; rolling bearing; spectral post-processing; structural defect signals; wavelet transform; Condition monitoring; Data mining; Feature extraction; Fourier transforms; Frequency; Pollution measurement; Spectral analysis; Time domain analysis; Wavelet analysis; Wavelet transforms;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Instrumentation and Measurement Technology Conference, 2002. IMTC/2002. Proceedings of the 19th IEEE
ISSN :
1091-5281
Print_ISBN :
0-7803-7218-2
Type :
conf
DOI :
10.1109/IMTC.2002.1006860
Filename :
1006860
Link To Document :
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