Title : 
Relationship between Microstructure and Ionic Conductivity in Ytterbium Doped Ceria
         
        
            Author : 
Ye, Fei ; Mori, Toshiyuki ; Ou, Ding Rong ; Zou, Jin ; Drennan, John
         
        
            Author_Institution : 
Ecomater. Center, Nat. Inst. for Mater. Sci., Ibaraki
         
        
        
        
        
            Abstract : 
Grain size dependence of ionic conductivities of Ce1-xYbxO2-x/2 (x=0.10, 0.15, 0.20 and 0.25) was studied. The conductivity decreased with decreasing grain size and reached the minimum value at the grain size about 0.43-0.91 mum depending on different dopant concentration. Then the conductivity increased with a continuous decrease in grain size. TEM observation indicated that aforementioned conductivity behavior was partially associated with the microstructures. Microdomains were observed in grains using TEM. HRTEM micrographs and electron diffraction patterns showed that the formation the microdomains was restrained by the decrease in grain size. The microdomains could possibly lower the conductivity and the reduction of the microdomains possibly contributes to the increase in the conductivity when the grain size was smaller than 0.43-0.91 mum
         
        
            Keywords : 
cerium compounds; doping profiles; electron diffraction; grain size; ionic conductivity; solid electrolytes; transmission electron microscopy; ytterbium; Ce1-xYbxO2-0.5x; HRTEM micrographs; TEM; dopant concentration; electron diffraction patterns; grain size dependence; ionic conductivity; microdomains; microstructure; solid electrolytes; ytterbium doped ceria; Chemical analysis; Conductivity measurement; Grain boundaries; Grain size; Materials science and technology; Microstructure; Tellurium; Temperature measurement; Transmission electron microscopy; Ytterbium; Conductivity; Electron diffraction; HRTEM; Microstructure;
         
        
        
        
            Conference_Titel : 
Environmentally Conscious Design and Inverse Manufacturing, 2005. Eco Design 2005. Fourth International Symposium on
         
        
            Conference_Location : 
Tokyo
         
        
            Print_ISBN : 
1-4244-0081-3
         
        
        
            DOI : 
10.1109/ECODIM.2005.1619374