Title :
Standard terminology for fundamental frequency and time metrology
Author :
Allan, David ; Hellwig, Helmut ; Kartaschoff, Peter ; Vanier, Jacques ; Vig, John ; Winkler, Gernot M R ; Yannoni, Nicholas F.
Author_Institution :
NBS, Boulder, CO, USA
Abstract :
Measures of frequency and phase instability in the time and frequency domains are reviewed. The particular choice as to which domain is used depends on the application. However, mathematical conversions from one domain to the other can present problems. Most of the major manufacturers now specify instability characteristics of their standard in terms of these recommended measures. This work thus defines and formalizes the general practice of more than a decade
Keywords :
frequency measurement; frequency stability; measurement standards; time measurement; frequency metrology; frequency stability; phase instability; time metrology; Frequency domain analysis; Frequency measurement; Manufacturing; Measurement standards; Metrology; NIST; Phase measurement; Stability; Terminology; Time measurement;
Conference_Titel :
Frequency Control Symposium, 1988., Proceedings of the 42nd Annual
Conference_Location :
Baltimore, MD
DOI :
10.1109/FREQ.1988.27634
