DocumentCode
1664131
Title
Extending the range and accuracy of phase noise measurements
Author
Walls, F.L. ; Clements, A.J.D. ; Felton, C.M. ; Lombardi, M.A. ; Vanek, M.D.
Author_Institution
NBS, Boulder, CO, USA
fYear
1988
Firstpage
432
Lastpage
441
Abstract
Recent progress in extending high-accuracy measurements of phase noise in oscillators and other devices are described for carrier frequencies from the RF to the millimeter region and Fourier frequencies up to 10% of the carrier (or a maximum of about 1 GHz). A brief survey of traditional precision techniques for measuring phase noise is included as a basis for comparing relative performance and limitations. Several calibration techniques are developed which, when combined with two previous oscillator techniques, permit one to calibrate all factors affecting the measurements of phase noise of oscillator pairs to an accuracy which typically exceeds 1 dB and in favorable cases can approach 0.4 dB
Keywords
calibration; electric noise measurement; electron device noise; oscillators; Fourier frequencies; RF; calibration; millimeter region; oscillators; phase noise measurements; Calibration; Frequency conversion; Frequency measurement; Frequency synthesizers; NIST; Noise measurement; Oscillators; Phase measurement; Phase noise; Q measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Frequency Control Symposium, 1988., Proceedings of the 42nd Annual
Conference_Location
Baltimore, MD
Type
conf
DOI
10.1109/FREQ.1988.27636
Filename
27636
Link To Document