• DocumentCode
    1664131
  • Title

    Extending the range and accuracy of phase noise measurements

  • Author

    Walls, F.L. ; Clements, A.J.D. ; Felton, C.M. ; Lombardi, M.A. ; Vanek, M.D.

  • Author_Institution
    NBS, Boulder, CO, USA
  • fYear
    1988
  • Firstpage
    432
  • Lastpage
    441
  • Abstract
    Recent progress in extending high-accuracy measurements of phase noise in oscillators and other devices are described for carrier frequencies from the RF to the millimeter region and Fourier frequencies up to 10% of the carrier (or a maximum of about 1 GHz). A brief survey of traditional precision techniques for measuring phase noise is included as a basis for comparing relative performance and limitations. Several calibration techniques are developed which, when combined with two previous oscillator techniques, permit one to calibrate all factors affecting the measurements of phase noise of oscillator pairs to an accuracy which typically exceeds 1 dB and in favorable cases can approach 0.4 dB
  • Keywords
    calibration; electric noise measurement; electron device noise; oscillators; Fourier frequencies; RF; calibration; millimeter region; oscillators; phase noise measurements; Calibration; Frequency conversion; Frequency measurement; Frequency synthesizers; NIST; Noise measurement; Oscillators; Phase measurement; Phase noise; Q measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Frequency Control Symposium, 1988., Proceedings of the 42nd Annual
  • Conference_Location
    Baltimore, MD
  • Type

    conf

  • DOI
    10.1109/FREQ.1988.27636
  • Filename
    27636