An Open Modular Test Concept for the DSP KISS-16V2
Author :
PreiBner, J. ; Mahlich, G. ; Schuck, James ; Sahm, Hans ; Weingart, P. ; Weinsziehr, D.
fYear :
1992
Firstpage :
678
Keywords :
Automatic testing; Circuit testing; Computer aided instruction; Concurrent computing; Digital signal processing; Digital signal processing chips; GSM; Hardware; Read only memory; Registers;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 1992. Proceedings., International
