DocumentCode :
1664573
Title :
Ratiometric BJT-based thermal sensor in 32nm and 22nm technologies
Author :
Shor, Joseph ; Luria, Kosta ; Zilberman, Dror
Author_Institution :
Intel, Yakum, Israel
fYear :
2012
Firstpage :
210
Lastpage :
212
Abstract :
Thermal sensors are used in modern microprocessors to provide information for: 1) throttling at the maximum temperature of operation, and 2) fan regulation at temperatures down to 50°C. Today´s microprocessors are thermally limited in many applications, so accurate temperature readings are essential in order to maximize performance. There are fairly large thermal gradients across the core, which vary for different instructions, so it is necessary to position thermal sensors near hot-spots. In addition, the locations of the hot-spots may not be predictable during the design phase. Thus it is necessary for hot-spot sensors to be small enough to be moved late in the design cycle or even after first Silicon.
Keywords :
bipolar transistors; microprocessor chips; temperature sensors; hot-spot sensors; microprocessors; ratiometric BJT-based thermal sensor; size 22 nm; size 32 nm; temperature 50 degC; temperature readings; thermal gradients; Calibration; Radiation detectors; Solid state circuits; Temperature measurement; Temperature sensors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Circuits Conference Digest of Technical Papers (ISSCC), 2012 IEEE International
Conference_Location :
San Francisco, CA
ISSN :
0193-6530
Print_ISBN :
978-1-4673-0376-7
Type :
conf
DOI :
10.1109/ISSCC.2012.6176979
Filename :
6176979
Link To Document :
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