• DocumentCode
    1664573
  • Title

    Ratiometric BJT-based thermal sensor in 32nm and 22nm technologies

  • Author

    Shor, Joseph ; Luria, Kosta ; Zilberman, Dror

  • Author_Institution
    Intel, Yakum, Israel
  • fYear
    2012
  • Firstpage
    210
  • Lastpage
    212
  • Abstract
    Thermal sensors are used in modern microprocessors to provide information for: 1) throttling at the maximum temperature of operation, and 2) fan regulation at temperatures down to 50°C. Today´s microprocessors are thermally limited in many applications, so accurate temperature readings are essential in order to maximize performance. There are fairly large thermal gradients across the core, which vary for different instructions, so it is necessary to position thermal sensors near hot-spots. In addition, the locations of the hot-spots may not be predictable during the design phase. Thus it is necessary for hot-spot sensors to be small enough to be moved late in the design cycle or even after first Silicon.
  • Keywords
    bipolar transistors; microprocessor chips; temperature sensors; hot-spot sensors; microprocessors; ratiometric BJT-based thermal sensor; size 22 nm; size 32 nm; temperature 50 degC; temperature readings; thermal gradients; Calibration; Radiation detectors; Solid state circuits; Temperature measurement; Temperature sensors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Circuits Conference Digest of Technical Papers (ISSCC), 2012 IEEE International
  • Conference_Location
    San Francisco, CA
  • ISSN
    0193-6530
  • Print_ISBN
    978-1-4673-0376-7
  • Type

    conf

  • DOI
    10.1109/ISSCC.2012.6176979
  • Filename
    6176979