DocumentCode :
1664948
Title :
A 0.004mm2 250μW ΔΣ TDC with time-difference accumulator and a 0.012mm2 2.5mW bang-bang digital PLL using PRNG for low-power SoC applications
Author :
Hong, Jong-Phil ; Kim, Sung-Jin ; Liu, Jenlung ; Xing, Nan ; Jang, Tae-Kwang ; Park, Jaejin ; Kim, Jihyun ; Kim, Taeik ; Park, Hojin
Author_Institution :
Samsung Electron., Yongin, South Korea
fYear :
2012
Firstpage :
240
Lastpage :
242
Abstract :
As digital CMOS technology scales to 32nm and below, small and low-voltage clock and timing generators are in high demand to avoid complex analog operations and to meet stringent phase noise requirements. There have been sever- al approaches to convert analog systems to their digital counterparts and a high- resolution time-to-digital converter (TDC) is a key element for the digitalization of analog circuits. Recently TDCs using a noise shaping technique with oversampling have been introduced to improve resolution. However, they tend to be power hungry or require analog-intensive circuitry as they convert signals from the time domain to the voltage domain in order to perform arithmetic operations. A digital PLL (DPLL) is another crucial SoC component, and low-power area-efficient DPLLs are challenging to design. This paper presents a time-domain low-power ΔΣ TDC with a time-difference accumulator and an area-efficient, low-power, and fast-lock DPLL composed of a synthesizable bang-bang phase and frequency detector (BB-PFD), with a gain boosting mode and a pseudo-random number generator (PRNG).
Keywords :
CMOS digital integrated circuits; delta-sigma modulation; phase locked loops; phase noise; random number generation; system-on-chip; ΔΣ TDC; analog systems; arithmetic operations; bang-bang digital PLL; digital CMOS technology; frequency detector; gain boosting mode; high-resolution time-to-digital converter; low-power SoC applications; noise shaping technique; phase noise requirements; power 2.5 mW; power 250 muW; pseudo-random number generator; time-difference accumulator; timing generators; Jitter; Phase frequency detector; Phase locked loops; Phase noise; Time domain analysis; Tuning;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Circuits Conference Digest of Technical Papers (ISSCC), 2012 IEEE International
Conference_Location :
San Francisco, CA
ISSN :
0193-6530
Print_ISBN :
978-1-4673-0376-7
Type :
conf
DOI :
10.1109/ISSCC.2012.6176992
Filename :
6176992
Link To Document :
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