A novel chelating surfactant templating pathway for preparation of Co3O4/silica mesoporous composite

Author

Niu, Kui ; Chen, Mingqing ; Ni, Zhongbin ; Fu, Chengwu

Author_Institution

Sch. of Chem. & Mater. Eng., Jiangnan Univ., Wuxi, China

fYear

2010

Firstpage

468

Lastpage

469

Abstract

A metal-containing surfactant [Co(HED3A)]^-N⁺ formed by trisodium N-hexadecyl ethylenediamine triacetate (3NaHED3A) and CoCl₂ was first used as template for synthesizing Co₃O₄/SiO₂ mesoporous composite. TG showed that the proper temperature for removal of template is 600Â°C. Nitrogen adsorption-desorption isotherms data confirmed that the composite has a high specific surface area and uniform pore size distribution. The morphology and structure of mesoporous composite were characterized by X-ray diffraction and HRTEM. Results show that the complex has regular cubic shape morphology with particle size in the range of 1-1.5 Â¿m. The material has a highly ordered cubic (pm3n) mesostructure and long-ranged ordered porous channel. Co₃O₄ was uniformly distributed in the well-defined channel as a result of the guiding role of the template.

Keywords

X-ray diffraction; cobalt compounds; composite materials; mesoporous materials; particle size; silicon compounds; surfactants; transmission electron microscopy; Co₃O₄-SiO₂; HRTEM; N-hexadecyl ethylenediamine triacetate; X-ray diffraction; chelating surfactant templating pathway; cubic mesostructure; cubic shape morphology; long-ranged ordered porous channel; mesoporous composite; nitrogen adsorption-desorption isotherms; particle size; pore size distribution; size 1 mum to 1.5 mum; specific surface area; Chemical engineering; Mesoporous materials; Morphology; Nitrogen; Organic chemicals; Reflection; Shape; Silicon compounds; Temperature; X-ray scattering;

fLanguage

English

Publisher

ieee

Conference_Titel

Nanoelectronics Conference (INEC), 2010 3rd International

Conference_Location

Hong Kong

Print_ISBN

978-1-4244-3543-2

Electronic_ISBN

978-1-4244-3544-9

Type

conf

DOI

10.1109/INEC.2010.5424829

Filename

5424829