DocumentCode
1665428
Title
Skewed-Load Transition Test: Part II, Coverage
Author
Patil, Srinivas ; Savir, Jacob
fYear
1992
Firstpage
714
Keywords
Capacitance; Circuit faults; Circuit testing; Clocks; Combinational circuits; Jacobian matrices; Latches; Logic circuits; Logic testing; Propagation delay;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1992. Proceedings., International
ISSN
1089-3539
Print_ISBN
0-7803-0760-7
Type
conf
DOI
10.1109/TEST.1992.527893
Filename
527893
Link To Document