Title :
Preparation and characterized of polyethylenimine-coated magnetic nanoparticles
Author :
Li, Cheng K. ; Yan, Biao ; Du, Chun F. ; Qi, Hong Z.
Author_Institution :
Shanghai Key Lab. of D&A for Metal-Functional Mater., Tongji Univ., Shanghai, China
Abstract :
In this paper, we prepared the magnetite nanoparticles coated with polyethlenimine, (CH2-CH2-NH)n with the coprecipitation method. X-ray diffraction (XRD) and Transmission Electron Microscope (TEM) methods were used to analyze their phase and size; The groups adhered on the surface were observed by Fourier transform infrared spectroscopy(FTIR); adsorption rate of the PEI was got by thermogravimetric analysis(TG) and magnetic properties were measured by vibrating sample magnetometer(VSM). Both uncoated and PEI-coated magnetic particles exhibited the superparamagnetic behavior and strong saturation magnetization at room temperature, about 70 cmu/g. The PEI-coated magnetic nanoparticles can be used in the fields of medical biotechnology, such as gene detection and vector for magnetic guidance etc.
Keywords :
Fourier transform spectra; X-ray diffraction; adhesion; adsorption; biochemistry; biomagnetism; biomedical materials; infrared spectra; magnetic particles; magnetisation; molecular biophysics; nanobiotechnology; nanoparticles; polymer films; precipitation (physical chemistry); superparamagnetism; thermal analysis; transmission electron microscopy; FTIR spectroscopy; Fourier transform infrared spectroscopy; TEM; TGA; VSM; X-ray diffraction; XRD; adsorption; coprecipitation; gene detection; magnetic nanoparticles; medical biotechnology; polyethylenimine-coated magnetic nanoparticles; saturation magnetization; superparamagnetism; surface adherence; temperature 293 K to 298 K; thermogravimetric analysis; transmission electron microscope; vibrating sample magnetometer; Fourier transforms; Infrared spectra; Magnetic analysis; Magnetic force microscopy; Nanoparticles; Saturation magnetization; Spectroscopy; Transmission electron microscopy; X-ray diffraction; X-ray scattering;
Conference_Titel :
Nanoelectronics Conference (INEC), 2010 3rd International
Conference_Location :
Hong Kong
Print_ISBN :
978-1-4244-3543-2
Electronic_ISBN :
978-1-4244-3544-9
DOI :
10.1109/INEC.2010.5424843