Using reduced-order models in D/A converter testing

Static models of D/A converters can efficiently be used for testing purposes. For high-resolution converters nonparametric nonlinearity tests are not practically feasible for production testing due to the long test time. Modeling the device error response using a limited number of model parameters, the minimal number of required test points is significantly decreased. As a consequence, it becomes possible to estimate the error characteristics of the device from a few test points. In the paper, methods to select model parameters are discussed. The results are verified by the processed measurement data of 100 D/A converters.