• DocumentCode
    1665822
  • Title

    Future technology challenge for giga bit DRAM generation

  • Author

    Lee, J.G.

  • Author_Institution
    Semicond. Res. & Dev. Center, Samsung Semicond., San Jose, CA, USA
  • fYear
    1995
  • Firstpage
    133
  • Lastpage
    137
  • Abstract
    Cost/performance DRAM developments in the industry have followed a set of remarkably consistent trends in cell area, chip area and performance for the last seven generation from 64K to 256 Mb and very likely through the eighth of 1Gb DRAM. New concepts on device and circuit design as well as technology innovations have been the key to allowing these trends to be met. The giga bit generation will very likely require a new breakpoint if the trends are to be continued. A few major areas of technology innovations have been key to the requirements, such as the lithography shrink ability (l.4× each generation), levels of metallization and fundamental limitation of device scaling to meet performance goal (1.25× chip level), high dielectric materials due to cell area reduction to meet cell capacitance, etc. The system designers will require higher performance. We must decide whether we tackle performance by a technological or by an architectural solution or both. This paper presents the highlights of the technology and concepts for future DRAMs with a focus on its key technology issues
  • Keywords
    DRAM chips; integrated circuit design; integrated circuit technology; isolation technology; lithography; 1 Gbit; cell area reduction; cell capacitance; circuit design; device scaling; dynamic RAM; giga bit DRAM generation; lithography; metallization; technology issues; Costs; Dielectric materials; Ferroelectric materials; Lighting; Lithography; Random access memory; Semiconductor device manufacture; Semiconductor materials; Technological innovation; X-ray lasers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State and Integrated Circuit Technology, 1995 4th International Conference on
  • Conference_Location
    Beijing
  • Print_ISBN
    0-7803-3062-5
  • Type

    conf

  • DOI
    10.1109/ICSICT.1995.499652
  • Filename
    499652