DocumentCode :
1665831
Title :
Photonic nano-structure of R. Gigantea
Author :
Ching, Suet Ying ; Li, Gui Xin ; Tam, Hoi Lam ; Goh, David T P ; Goh, Joseph K L ; Cheah, Kok Wai
Author_Institution :
Dept. of Phys., Hong Kong Baptist Univ., Kowloon Tong, China
fYear :
2010
Firstpage :
1360
Lastpage :
1361
Abstract :
Rhomborhina Gigantea (R. Gigantea) was examined for its iridescent properties in its exocuticle. The iridescence was explained by the theories of the optical reflectors causing the structural colors and the concepts of cholesteric liquid crystals (CLCs). The exocuticle was examined for its optical properties through experiments of reflection and diffraction. Reflection spectra showed contrast results in transverse electric (TE) and transverse magnetic (TM) modes. The cross-section of the beetle cuticle structure was investigated using scanning electron microscope (SEM). The experimental values of average refraction index (nav) and the half-pitch (Ph) were derived from the optimal Bragg condition. The observed Ph from SEM images was similar to the experimental values in linear polarization. The average refractive indices determined from the optical data in both TE and TM modes were in god agreement to the predicted value. The consistency of the results implied that the structure responsible for the iridescent beetle was a biological analogue to CLCs.
Keywords :
bio-optics; cholesteric liquid crystals; photonic crystals; reflectivity; refractive index; scanning electron microscopy; zoology; Rhomborhina Gigantea; SEM; beetle cuticle structure; cholesteric liquid crystals; diffraction; exocuticle; iridescent properties; linear polarization; optical properties; optimal Bragg condition; photonic nanostructure; reflection spectra; refraction index; scanning electron microscope; transverse electric modes; transverse magnetic modes; Biomedical optical imaging; Electron optics; Liquid crystals; Nanobioscience; Optical reflection; Optical refraction; Optical variables control; Photonic crystals; Scanning electron microscopy; Tellurium;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nanoelectronics Conference (INEC), 2010 3rd International
Conference_Location :
Hong Kong
Print_ISBN :
978-1-4244-3543-2
Electronic_ISBN :
978-1-4244-3544-9
Type :
conf
DOI :
10.1109/INEC.2010.5424857
Filename :
5424857
Link To Document :
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