Title :
Terahertz profilometer by time-domain polarimetry
Author :
Yasumatsu, Naoya ; Watanabe, Shinichi
Author_Institution :
Dept. of Phys., Keio Univ., Yokohama, Japan
Abstract :
We experimentally show that continuously changing polarity of an elliptically-polarized terahertz electric-field can be used to image a height profile of semiconductors, metals, and their hybrid samples with a depth resolution of ~1 μm.
Keywords :
ellipsometry; polarimetry; terahertz wave devices; terahertz wave imaging; depth resolution; elliptically-polarized terahertz electric-field; height of; hybrid samples; metals; semiconductors; terahertz profilometer; time-domain polarimetry; Image resolution; Imaging; Optical surface waves; Polarimetry; Surface topography; Surface waves; Ultrafast optics;
Conference_Titel :
Lasers and Electro-Optics (CLEO), 2012 Conference on
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-4673-1839-6
