Title :
A 6b 10MS/s current-steering DAC manufactured with amorphous Gallium-Indium-Zinc-Oxide TFTs achieving SFDR > 30dB up to 300kHz
Author :
Raiteri, Daniele ; Torricelli, Fabrizio ; Myny, Kris ; Nag, Manoj ; Van der Putten, Bas ; Smits, Edsger ; Steudel, Soeren ; Tempelaars, Karin ; Tripathi, Ashutosh ; Gelinck, Gerwin ; Van Roermund, Arthur ; Cantatore, Eugenio
Author_Institution :
Eindhoven Univ. of Technol., Eindhoven, Netherlands
Abstract :
Amorphous Gallium-lndium-Zinc-Oxide (GIZO or IGZO) has been recently pro- posed [1] as an interesting semiconductor for manufacturing TFTs because of its mobility (μ~20cm7Vs), superior to other common materials for large-area elec- tronics like organic semiconductors and a-Si (μ~1cm7Vs). The amorphous nature of GIZO grants also a good uniformity, contrary to Low Temperature Polycrystalline Silicon (LTPS), which still offers the best mobility among large- area TFT technologies (μ~100cm2Λ/s). The optical transparency and the relative- ly low fabrication temperature (<;150°C) make this technology especially suitable for display backplanes and relative driving electronics [2], as well as for any kind of large-area applications on plastic foils, e.g. biomedical sensors, non-volatile memories [3], RFIDs [4], etc.
Keywords :
digital-analogue conversion; gallium compounds; indium; indium compounds; organic semiconductors; thin film transistors; zinc compounds; DAC; GaInZnO; RFIDs; amorphous TFT; biomedical sensors; display backplanes; frequency 300 kHz; large-area electronics; low temperature polycrystalline silicon; non-volatile memories; organic semiconductors; plastic foils; thin film transistors; Backplanes; Current measurement; Frequency measurement; Logic gates; Organic light emitting diodes; Semiconductor device measurement; Thin film transistors;
Conference_Titel :
Solid-State Circuits Conference Digest of Technical Papers (ISSCC), 2012 IEEE International
Conference_Location :
San Francisco, CA
Print_ISBN :
978-1-4673-0376-7
DOI :
10.1109/ISSCC.2012.6177028