DocumentCode :
1665956
Title :
The pull-in of symmetrically and asymmetrically driven microstructures and the use in DC voltage references
Author :
Rocha, L.A. ; Cretu, E. ; Wolffenbuttel, R.F.
Author_Institution :
Delft Univ. of Technol., Netherlands
Volume :
1
fYear :
2002
fDate :
6/24/1905 12:00:00 AM
Firstpage :
759
Abstract :
Micromechanical structures have been designed, fabricated in silicon and tested for use as on-chip voltage reference Applications are in electrical metrology and in integrated silicon Microsystems. Microbeams of 100 μm length, 3 μm width and 11 μm thickness are electrostatically actuated with a very reproducible pull-in voltage. The structure can be either symmetrically or asymmetrically actuated, resulting in different pull-in voltages, as well as different operational specifications e.g. hysteresis and reproducibility. A two dimensional energy-based analytical model for the static pull-in is derived for both actuation types and compared with measurements. Devices have been designed and fabricated in an epi-poly process. Measurements show a pull-in voltage in the 9.1-9.5 V range for the asymmetric case and 10.5-11 V range for the symmetric case, both in agreement with modeling.
Keywords :
electrostatic actuators; hysteresis; measurement standards; mechanical stability; micromachining; voltage measurement; 10.5 to 11 V; 9.1 to 9.5 V; DC voltage reference; Taylor series; asymmetrically driven microstructures; electrostatically actuated microbeams; epi-poly process; equilibrium point coordinates; freestanding lateral beam; hysteresis; integrated silicon microsystems; local continuation method; long-term device stability; on-chip voltage reference; pull-in microstructure; reproducible pull-in voltage; static pull-in; surface micromachining; symmetrically driven microstructures; two dimensional energy-based analytical model; Analytical models; Energy measurement; Hysteresis; Metrology; Micromechanical devices; Microstructure; Reproducibility of results; Silicon; Testing; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Instrumentation and Measurement Technology Conference, 2002. IMTC/2002. Proceedings of the 19th IEEE
ISSN :
1091-5281
Print_ISBN :
0-7803-7218-2
Type :
conf
DOI :
10.1109/IMTC.2002.1006937
Filename :
1006937
Link To Document :
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