DocumentCode :
1666023
Title :
Field emitter arrays for high-current, high-current density, and high frequency operation
Author :
Spindt, C.A.
Author_Institution :
SRI Int., Menlo Park, CA
fYear :
2004
Firstpage :
20
Lastpage :
21
Abstract :
Common issues of interest when considering a cathode for microwave tube applications are total current, current density, emittance, and parasitic capacitance if beam pre-bunching is planned. Single SRI Spindt-type emitter tips have been shown to be capable of producing over 1 mA of emission when properly processed. However, when working with large arrays of tips, achieving an average emission per tip greater than about 10 muA/tip has been elusive due primarily to insufficient uniformity from tip to tip in the as-fabricated arrays. Recent work in addressing this issue has shown that it is possible to improve tip-to-tip emission uniformity with a pulse-conditioning technique currently under development. Using recently developed lithography techniques, emitter arrays are now fabricated with gate aperture diameters of 0.35 mum and a 1-mum aperture or tip pitch (1-mum space between apertures and tips, or 108 tips/cm2). This configuration would have approximately 785,000 tips in a 1-mm-diameter area, and an average tip loading of less than 1.5 muA/tip would produce 1 amp of total peak emission with a current density of about 130 A/cm2, exceeding most vacuum tube requirements
Keywords :
capacitance; cathodes; current density; field emitter arrays; lithography; microwave tubes; vacuum tubes; 1 mm; Spindt-type emitter tips; beam pre-bunching; cathode; current density; emittance; emitter arrays; field emitter arrays; gate aperture diameter; high frequency operation; lithography; microwave tube applications; parasitic capacitance; pulse-conditioning technique; tip loading; tip pitch; tip-tip emission uniformity; total current; total peak emission; vacuum tube; Apertures; Capacitance; Cathodes; Current density; Electrodes; Field emitter arrays; Frequency; Microwave antenna arrays; Silicon; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Vacuum Nanoelectronics Conference, 2005. IVNC 2005. Technical Digest of the 18th International
Conference_Location :
Oxford
Print_ISBN :
0-7803-8397-4
Type :
conf
DOI :
10.1109/IVNC.2005.1619464
Filename :
1619464
Link To Document :
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