DocumentCode :
1666129
Title :
A 175µW 100MHz-2GHz inductorless receiver front-end in 65nm CMOS
Author :
Michaelsen, J.A. ; Wisland, D.T.
Author_Institution :
Dept. of Inf., Univ. of Oslo, Oslo, Norway
fYear :
2010
Firstpage :
1
Lastpage :
4
Abstract :
A digital process, voltage, and temperature (PVT) calibration loop for a Frequency-to-Voltage converter (FVC) is presented. The FVC needs a precisely controlled delay element, but delay in CMOS is highly dependent on the PVT condition making it necessary to calibrate the delay line. The system is designed to calibrate against an external reference frequency which is already present in the intended application. This is advantageous, as it is not necessary to generate additional bandgap or other reference on chip. Results from transistor level simulations using a 90 nm CMOS process are presented, showing good regulation across PVT corners and ability to track changes in the PVT condition. The calibration loop is digital and therefore a good fit for CMOS technology.
Keywords :
CMOS digital integrated circuits; calibration; energy gap; voltage-frequency convertors; CMOS process; CMOS technology; bandgap; controlled delay element; digital PVT calibration; external reference frequency; frequency-to-voltage converter; process calibration; size 90 nm; temperature calibration; transistor level simulations; voltage calibration; Calibration; Delay; Delay lines; Linearity; Radiation detectors; Tuning; Voltage-controlled oscillators; CMOS; Front-end; LNA; Low Noise Amplifier; Mixer; impedance matching; inductorless; ultra low power;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
NORCHIP, 2010
Conference_Location :
Tampere
Print_ISBN :
978-1-4244-8972-5
Electronic_ISBN :
978-1-4244-8971-8
Type :
conf
DOI :
10.1109/NORCHIP.2010.5669482
Filename :
5669482
Link To Document :
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