Title :
A static and dynamic model for a silicon carbide power MOSFET
Author :
Phankong, Nathabhat ; Funaki, Tsuyoshi ; Hikihara, Takashi
Author_Institution :
Dept. of Electr. Eng., Kyoto Univ., Kyoto, Japan
Abstract :
Static C-V and I-V characteristics related dynamic behaviors of power MOSFET. Models for Si power MOSFET have already been obtained through the previous studies. Based on the model, a model for SiC power MOSFET is proposed that includes the physics of semiconductor, physical structures of the device, and extracted parameters from the measured C-V characteristics. The static I-V characteristics are also discussed with the C-V characteristics. It is clearly shown that the simulated results in switching behavior of the proposed model coincide with experimental results suitably in some conditions.
Keywords :
power MOSFET; silicon compounds; wide band gap semiconductors; C-V characteristics; I-V characteristics; SiC; power MOSFET; switching behavior; Capacitance; Capacitance-voltage characteristics; MOSFET circuits; Power MOSFET; Power semiconductor switches; Semiconductor process modeling; Silicon carbide; Steady-state; Uniform resource locators; Voltage; Device characterization; MOSFET; Modeling; Power semiconductor device; Silicon Carbide;
Conference_Titel :
Power Electronics and Applications, 2009. EPE '09. 13th European Conference on
Conference_Location :
Barcelona
Print_ISBN :
978-1-4244-4432-8
Electronic_ISBN :
978-90-75815-13-9