DocumentCode :
1666239
Title :
Dynamic optical tweezers: Experiment
Author :
Mitatha, S. ; Noppanakeepong, S. ; Ali, J. ; Yupapin, P.P.
Author_Institution :
Fac. of Eng., King Mongkut´´s Inst. of Technol. Ladkrabang, Bangkok, Thailand
fYear :
2010
Firstpage :
1325
Lastpage :
1326
Abstract :
We have experimentally generated the optical tweezers in the form of a dark soliton pulse using the Stimulated Brillouin Scattering (SBS) system. This is the first time ever found on the use of the highly intense pulse in the form of a dark soliton to perform the dynamic light trapping probe known as a ¿dynamic optical tweezers¿. The advantage of the generated tweezers is that it can be used to transmit and transport the trapping atom/molecule into the optical device and communication network, which can be claimed as the dynamic optical tweezers transportation, for used in many frontier applications. The multi-optical tweezers generated, with high capacity regime can then be used for multi-optical tweezers transmission. The various applications to form the frontier research using photon, atom, molecule, DNA, electron and ion trapping for atomic tools, tiny synchrotron, molecular networks, bottom up atom/molecule assembly, ozone repair etc. are described. The experimental details and model of the optical tweezers generation and related characteristics are described. The interesting simulation results of a dark soliton generation for the optical tweezers are also analyzed and discussed in various applications.
Keywords :
optical solitons; radiation pressure; stimulated Brillouin scattering; communication network; dark soliton pulse; dynamic light trapping probe; dynamic optical tweezers; multi-optical tweezers transmission; optical device; stimulated Brillouin scattering system; Atom optics; Brillouin scattering; Charge carrier processes; Electron optics; Nonlinear optics; Optical pulse generation; Optical scattering; Optical solitons; Particle beam optics; Stimulated emission;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nanoelectronics Conference (INEC), 2010 3rd International
Conference_Location :
Hong Kong
Print_ISBN :
978-1-4244-3543-2
Electronic_ISBN :
978-1-4244-3544-9
Type :
conf
DOI :
10.1109/INEC.2010.5424872
Filename :
5424872
Link To Document :
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