• DocumentCode
    1666678
  • Title

    All Tests for a Fault are Not Eyually Valuable for Defect Detection

  • Author

    Kapur, Rohit ; Park, Jaehong ; Mercer, M. Ray

  • fYear
    1992
  • Firstpage
    762
  • Keywords
    Circuit faults; Circuit testing; Contracts; Electrical fault detection; Fabrication; Fault detection; Logic circuits; Logic testing; Manufacturing; Semiconductor device manufacture;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1992. Proceedings., International
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-0760-7
  • Type

    conf

  • DOI
    10.1109/TEST.1992.527898
  • Filename
    527898
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1666678