1666678

All Tests for a Fault are Not Eyually Valuable for Defect Detection

Kapur, Rohit ; Park, Jaehong ; Mercer, M. Ray

1992

762

Circuit faults; Circuit testing; Contracts; Electrical fault detection; Fabrication; Fault detection; Logic circuits; Logic testing; Manufacturing; Semiconductor device manufacture;

English

ieee

Test Conference, 1992. Proceedings., International

1089-3539

0-7803-0760-7

conf

10.1109/TEST.1992.527898

527898