• DocumentCode
    1666772
  • Title

    Multimode rate-equation-based VCSEL thermal and spatial model of circuit level

  • Author

    Shi, Xinzhi ; Qi, Chan ; Wang, Gaofeng ; Hu, Jicheng ; Liu, Feng

  • Author_Institution
    Inst. of Microelectron. & Inf. Technol., Wuhan Univ., Wuhan, China
  • fYear
    2010
  • Firstpage
    1297
  • Lastpage
    1298
  • Abstract
    In recent years, the characteristics of VCSELs have improved enormously that they have attracted more considerable interest. The corresponding developments of circuit-level VCSEL models are required for use in the design and simulation of optoelectronic applications. Unfortunately, existing models lack either the computational efficiency or the comprehensiveness warranted. In this paper, we present a VCSEL model that addresses the spatial dependent and thermal behavior of VCSELs based on multimode rate equations without sacrificing the numerical efficiency demanded by the circuit-level simulation of optoelectronic systems. Moreover, the thermal behavior is modeled by a laser diode based on Tucker´s model with the parameters extracted directly by method of Gao and temperature dependent parasitic resistor and reverse saturation current are also considered. The equivalent circuit of the model is given and it is implemented into SPICE-like simulators to simulate the dc, ac and transient features of a 863 nm bottom-emitting AlGaAs VCSEL. The simulated results exhibit good agreements with references.
  • Keywords
    III-V semiconductors; aluminium compounds; equivalent circuits; integrated optics; integrated optoelectronics; surface emitting lasers; AlGaAs; Tucker model; bottom emitting VCSEL; circuit level VCSEL; circuit level simulation; multimode rate equation; optoelectronic application; spatial model; thermal model; Circuit simulation; Computational efficiency; Computational modeling; Diode lasers; Equations; Equivalent circuits; Resistors; Temperature dependence; Thermal resistance; Vertical cavity surface emitting lasers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nanoelectronics Conference (INEC), 2010 3rd International
  • Conference_Location
    Hong Kong
  • Print_ISBN
    978-1-4244-3543-2
  • Electronic_ISBN
    978-1-4244-3544-9
  • Type

    conf

  • DOI
    10.1109/INEC.2010.5424891
  • Filename
    5424891