Title :
CTR degradation and ageing problem of optocouplers
Author_Institution :
13 Ch. de Riant-Coin, Switzerland
Abstract :
The paper reviews the optocoupler ageing problem, the main causes of the potential CTR degradation, the explanation of the increase in the proportion of recombination current, and certain important aspects of the reliability of optocouplers
Keywords :
ageing; opto-isolators; optoelectronic devices; semiconductor device reliability; CTR degradation; ageing; current transfer ratio; optocouplers; recombination current; reliability; Aging; Current density; Degradation; Electron emission; Light emitting diodes; Photoconductivity; Power system modeling; Radiative recombination; Spontaneous emission; Temperature;
Conference_Titel :
Solid-State and Integrated Circuit Technology, 1995 4th International Conference on
Conference_Location :
Beijing
Print_ISBN :
0-7803-3062-5
DOI :
10.1109/ICSICT.1995.499774
