Title :
Finite element modelling of electron transport in structures involving secondary electron emission and wall charging
Author_Institution :
MIMIV Ltd., Hartlepool, UK
Abstract :
The following have been reported on modelling of real hop plates in this paper: 1) It took about a month of programming to develop an initial version of the custom part of the software. 2) A model is solved in hours, rather than weeks for the Monte Carlo method. 3) The models settle into a stable state, in which the surface charge tends to produce an electric field along the walls which is fairly constant, and lower than the field with no charge. This works for a range of secondary emission parameters. 4) The calculated trajectories and field distributions are in good agreement with the published Monte Carlo simulations.
Keywords :
finite element analysis; plates (structures); secondary electron emission; surface charging; electric field; electron transport; finite element modelling; real hop plates; secondary electron emission; surface charge; wall charging; Acceleration; Electron emission; Electron sources; Electrostatics; Field emitter arrays; Finite element methods; Glass; Insulation life; Packaging; Surface charging;
Conference_Titel :
Vacuum Nanoelectronics Conference, 2005. IVNC 2005. Technical Digest of the 18th International
Print_ISBN :
0-7803-8397-4
DOI :
10.1109/IVNC.2005.1619507