1667190

A Comparison of Defect Models for Fault Location with Iddq Measurements

Aitken, Robert C.

1992

778

Circuit faults; Circuit testing; Current measurement; Electrical fault detection; Fault diagnosis; Fault location; Predictive models; Semiconductor device modeling; System testing; Voltage;

English

ieee

Test Conference, 1992. Proceedings., International

1089-3539

0-7803-0760-7

conf

10.1109/TEST.1992.527900

527900