• DocumentCode
    1667190
  • Title

    A Comparison of Defect Models for Fault Location with Iddq Measurements

  • Author

    Aitken, Robert C.

  • fYear
    1992
  • Firstpage
    778
  • Keywords
    Circuit faults; Circuit testing; Current measurement; Electrical fault detection; Fault diagnosis; Fault location; Predictive models; Semiconductor device modeling; System testing; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1992. Proceedings., International
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-0760-7
  • Type

    conf

  • DOI
    10.1109/TEST.1992.527900
  • Filename
    527900
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1667190