DocumentCode
1667206
Title
Field screening by amorphous carbon thin films
Author
Xanthakis, J.P. ; Forbes, Richard G.
Author_Institution
Dept. of Electr. & Comput. Eng., Athens Nat. Tech. Univ., Greece
fYear
2005
Firstpage
107
Lastpage
108
Abstract
We argue that the granularity of the screening charge distribution at or in the film surface may dominate the physics of field penetration into hopping conductors (including a-c:H films) and that a re-think of all related modelling looks necessary.
Keywords
amorphous state; carbon; field emission; granular structure; hopping conduction; thin films; C; amorphous carbon thin films; field penetration; field screening; film surface; granularity; hopping conductors; screening charge distribution; Amorphous materials; Carbon dioxide; Conducting materials; Electron emission; Materials science and technology; Physics computing; Semiconductor films; Semiconductor materials; Semiconductor thin films; Transistors;
fLanguage
English
Publisher
ieee
Conference_Titel
Vacuum Nanoelectronics Conference, 2005. IVNC 2005. Technical Digest of the 18th International
Print_ISBN
0-7803-8397-4
Type
conf
DOI
10.1109/IVNC.2005.1619508
Filename
1619508
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