Title :
Non-EOS root causes of EOS-like damage
Author :
Righter, Alan ; Wolfe, Ed ; Hajjar, Jean-Jacques
Author_Institution :
Analog Devices, Wilmington, MA, USA
Abstract :
Failures resembling damage from electrical overstress (EOS) may not always have their root cause related to a direct EOS transient. The authors describe examples from packaging, manufacturing and test where the damage signature was EOS although the root cause was non-EOS in origin. Containment and/or resolution in each case is reviewed.
Keywords :
electrostatic discharge; failure analysis; EOS-like damage; ESD; damage signature; direct EOS transient; electrical overstress; failure resembling damage; nonEOS root causes; Capacitors; Delamination; Earth Observing System; Integrated circuits; Materials; Microassembly; Pins;
Conference_Titel :
Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2014 36th
Conference_Location :
Tucson, AZ
